Device testing contactor, method of producing the

专利名称：Device testing contactor, method of

producing the same, and device testingcarrier

发明人：Makoto Haseyama,Shigeyuki Maruyama申请号：US10308025申请日：20021203公开号：US06643922B2公开日：20031111

专利附图：

摘要：A contactor used for testing a semiconductor device is provided. Thesemiconductor device testing contactor is electrically connected to electrodes of a

semiconductor device to be tested. Such a contactor includes a wiring board and a firstreinforcing member for reinforcing the wiring board. The contactor has a flexible basefilm and device connecting pads to be electrically connected to the electrodes of thesemiconductor device. The first reinforcing member is disposed on the surface oppositeto the semiconductor device connecting surface of the wiring board. The wiring boardand the first reinforcing member are collectively bonded.

申请人：FUJITSU LIMITED

代理机构：Armstrong, Westerman & Hattori, LLP

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